Oblique incidence and observation electronic speckle-pattern interferometry.

نویسندگان

  • C Joenathan
  • B Franze
  • H J Tiziani
چکیده

In this paper we discuss an oblique incidence and observation electronic speckle-pattern interferometer, in which we use an anamorphic prism in front of the object. A collimated beam traveling through the prism is partly reflected at the base of the prism. The reflected light is the reference beam and the transmitted light illuminates the diffuse object, thereby generating the object beam. In this scheme the object and the reference beams are collinear. A new scheme that uses two prisms and permits phase stepping is also presented.

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عنوان ژورنال:
  • Applied optics

دوره 33 31  شماره 

صفحات  -

تاریخ انتشار 1994